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| UL Lafayette |
THE JINDAL LAB
| THE RESEARCH TEAM | ||
| NAME | TOPIC | |
| Gervais boudreaux | gervais@louisiana.edu | On-wafer High Frequency Noise Measurements |
| Rakesh Reddy Vadyala | rrv6522@louisiana.edu | Low Frequency Thermal Noise Measurements on MOSFETs (Wafer level and packaged devices) |
| Anita Patel | axp0565@louisiana.edu | MOS Amplifier Noise performance optimization |
| sunil Reddy vallur | skv2493@louisiana.edu | High Frequency thermal noise modeling for short channel MOSFETs |
| PARIMAL DEVULAPALLI | parimal@louisiana.edu | |
| pradeep patalay | prp2374@louisiana.edu | |
| vijay bhaskar | vbn4534@louisiana.edu | |
| vinayak mahajan | vmm3480@louisiana.edu | High frequency characterization of CMOS devices |
| ALUMNI | |
| NAME | TOPIC |
| Saurabh Sharma | PN Junction Modeling |
| Jai Dialani | Wireless System Performance |
| Abhishek Kapoor | Capacitance Modeling |
| Saurabh Sirohi | MOSFET Noise Measurements |
| Smitha dronavallI | Band Calculations, Amplifier Noise |
| Abhay Deshpande | High Frequency Thermal Noise |
