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R. P. Jindal, “Compact Noise Models for MOSFETs”, Invited paper in the special issue on Advanced Compact Models and 45-nm Modeling Challenges, IEEE Transactions on Electron Devices, vol. ED-53, pp. 2051-2061, 2006. R. P. Jindal, “Approaching Fundamental Limits on Optical Signal Detection”, Invited paper in special issue on Fluctuation Phenomena in Electronic and Photonic Devices, IEEE Transactions on Electron Devices, vol. ED-41, pp. 2133-2138, November 1994. |